HYDROGEN-INDUCED REORDERING OF THE SI(111)(ROOT-3X-ROOT-3)-BI SURFACESTUDIED BY SCANNING-TUNNELING-MICROSCOPY

Citation
M. Naitoh et al., HYDROGEN-INDUCED REORDERING OF THE SI(111)(ROOT-3X-ROOT-3)-BI SURFACESTUDIED BY SCANNING-TUNNELING-MICROSCOPY, Applied surface science, 123, 1998, pp. 171-175
Citations number
18
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
123
Year of publication
1998
Pages
171 - 175
Database
ISI
SICI code
0169-4332(1998)123:<171:HROTSS>2.0.ZU;2-Q
Abstract
We report results of a scanning tunneling microscopy investigation of the process of hydrogen adsorption on bismuth-deposited Si(111) surfac es. Two domains with the root 3 X root 3 periodicity are contained in the Si(111)(root 3 X root 3)-Bi surface, i.e., a low Bi-coverage root 3 domain (named alpha-phase) and a high Bi-coverage root 3 domain (bet a-phase). When atomic hydrogen adsorbs on the Si(111)(root 3 x root 3) -Bi surface, we found that (1) hydrogen atoms adsorb on the alpha-phas e in preference to the beta-phase, (2) Bi atoms are displaced from the ir original positions, and (3) bulk-like 1 X 1 surface structures appe ar in the restlayer. (C) 1998 Elsevier Science B.V.