LCAO CALCULATIONS OF SULFUR INTERLAYERS ON GE(001) AND SI(001)-K INTERFACES

Citation
R. Whittle et al., LCAO CALCULATIONS OF SULFUR INTERLAYERS ON GE(001) AND SI(001)-K INTERFACES, Applied surface science, 123, 1998, pp. 560-566
Citations number
31
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
123
Year of publication
1998
Pages
560 - 566
Database
ISI
SICI code
0169-4332(1998)123:<560:LCOSIO>2.0.ZU;2-I
Abstract
We present the results of an LD-LCAO (local-density linear-combination -of-atomic-orbitals) study on the effect of introducing an interlayer of S into K-Ge(001) and Si(001) interfaces. Total energy calculations of the Ge and Si interfaces, indicate that the S interlayer appears to chemically stabilise the interface, lending to a 1 X 1 S-interlayer o n a bulk terminated semiconductor. Subsequent deposition of K produces a non-disruptive K monolayer in which the K atoms occupy a 'bridge' p osition (corresponding to that of a continued bulk structure). The DOS (density of states) of the K overlayer hows that the surface is metal lic with the Fermi level pinned near the top of the Ge and Si band gap s. (C) 1998 Elsevier Science B.V.