CHARACTERIZATION OF NORMAL AND INVERTED INTERFACES BY THE ZEEMAN-EFFECT IN CD1-XMNXTE CDTE/CD1-YMGYTE QUANTUM-WELLS/

Citation
A. Lemaitre et al., CHARACTERIZATION OF NORMAL AND INVERTED INTERFACES BY THE ZEEMAN-EFFECT IN CD1-XMNXTE CDTE/CD1-YMGYTE QUANTUM-WELLS/, Physical review. B, Condensed matter, 57(8), 1998, pp. 4708-4712
Citations number
10
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
57
Issue
8
Year of publication
1998
Pages
4708 - 4712
Database
ISI
SICI code
0163-1829(1998)57:8<4708:CONAII>2.0.ZU;2-O
Abstract
We present a study of che interface profile in asymmetric Cd1-xMnxTe/C dTe/Cd1-yMgyTe quantum wells, with normal (Cd1-xMnxTe on CdTe) and inv erted (CdTe on Cd1-xMnxTe) interfaces, The Zeeman spectra of the confi ned exciton states were determined by magnetoreflectivity and Kerr rot ation measurements. Using a segregation model and an asymmetric expone ntial profile, we interpret the Zeeman spectra of quantum wells, and d etermine the interface widths. For the same concentrations of Mn in th e barriers and the same growth conditions, the results can be coherent ly explained assuming an interface width independent of the quantum-we ll width and the type of interface (normal or inverted). [S0163-1829(9 8)04607-4].