EFFECTS OF INTERFACIAL CHARGES ON ELECTRICAL ASYMMETRY OF EPITAXIAL BI4TI3O12 THIN-FILM CAPACITORS

Citation
Bh. Park et al., EFFECTS OF INTERFACIAL CHARGES ON ELECTRICAL ASYMMETRY OF EPITAXIAL BI4TI3O12 THIN-FILM CAPACITORS, Journal of the Korean Physical Society, 32, 1998, pp. 1405-1407
Citations number
12
Categorie Soggetti
Physics
ISSN journal
03744884
Volume
32
Year of publication
1998
Part
4
Supplement
S
Pages
1405 - 1407
Database
ISI
SICI code
0374-4884(1998)32:<1405:EOICOE>2.0.ZU;2-U
Abstract
An apparently symmetric Pt/Bi4Ti3O12/Pt capacitor structure was fabric ated on MgO(001) substrate. Current-voltage measurement showed rectify ing hysteresis and polarization-voltage measurement revealed strong im print failure. To understand these interesting phenomena, capacitance- voltage (C-V) measurements were performed. By fitting the C-V data wit h a model which describes the Pt/BTO/Pt structure as a series circuit of three capacitors, built-in voltages at the top and the bottom inter faces were determined to be 1.1 V and 3.2 V, respectively. By applying the polarization-dependent permittivity model with the experimental v alues of the asymmetric built-in voltages, the current hysteresis coul d be described.