COMPARISON BETWEEN TIO2 THIN-FILMS ON INP AND GAAS SUBSTRATES BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION

Citation
Yk. Han et al., COMPARISON BETWEEN TIO2 THIN-FILMS ON INP AND GAAS SUBSTRATES BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Journal of the Korean Physical Society, 32, 1998, pp. 1697-1699
Citations number
9
Categorie Soggetti
Physics
ISSN journal
03744884
Volume
32
Year of publication
1998
Part
4
Supplement
S
Pages
1697 - 1699
Database
ISI
SICI code
0374-4884(1998)32:<1697:CBTTOI>2.0.ZU;2-3
Abstract
Titanium dioxide (TiO2) thin films have been grown on InP(100) and GaA s(100) substrates by metal organic chemical vapor deposition. The TiO2 films on InP substrates were mainly rutile phase with [110] preferred orientation while those on GaAs substrates under identical deposition conditions showed polycrystalline behavior of dominant anatase phases . Taking into account lattice mismatch consideration, three unit cells of InP(100) substrate are possibly matched with four unit cells of ru tile TiO2 thin film in the TiO2[110] direction. Polycrystalline films on GaAs(100) were observed in TEM image due to large lattice misfit co ndition. The lattice mismatches between substrate and thin films may b e one of main parameters to determine the formation of single phase of TiO2 at low deposition temperature.