Yk. Han et al., COMPARISON BETWEEN TIO2 THIN-FILMS ON INP AND GAAS SUBSTRATES BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Journal of the Korean Physical Society, 32, 1998, pp. 1697-1699
Titanium dioxide (TiO2) thin films have been grown on InP(100) and GaA
s(100) substrates by metal organic chemical vapor deposition. The TiO2
films on InP substrates were mainly rutile phase with [110] preferred
orientation while those on GaAs substrates under identical deposition
conditions showed polycrystalline behavior of dominant anatase phases
. Taking into account lattice mismatch consideration, three unit cells
of InP(100) substrate are possibly matched with four unit cells of ru
tile TiO2 thin film in the TiO2[110] direction. Polycrystalline films
on GaAs(100) were observed in TEM image due to large lattice misfit co
ndition. The lattice mismatches between substrate and thin films may b
e one of main parameters to determine the formation of single phase of
TiO2 at low deposition temperature.