POLING BEHAVIOR AT THE GRAIN-BOUNDARIES OF PZT THIN-FILMS INVESTIGATED BY MEANS OF ELECTRIC FORCE MICROSCOPY

Citation
K. Franke et al., POLING BEHAVIOR AT THE GRAIN-BOUNDARIES OF PZT THIN-FILMS INVESTIGATED BY MEANS OF ELECTRIC FORCE MICROSCOPY, Journal of the Korean Physical Society, 32, 1998, pp. 1143-1145
Citations number
10
Categorie Soggetti
Physics
ISSN journal
03744884
Volume
32
Year of publication
1998
Part
3
Supplement
S
Pages
1143 - 1145
Database
ISI
SICI code
0374-4884(1998)32:<1143:PBATGO>2.0.ZU;2-N
Abstract
The Electric Force Microscope is used to investigate the poling behavi our of ferroelectric PZT thin films. Successively measured polarizatio n distributions were compared with high resolution The poling characte ristics are investigated separately at the grain boundaries and inside the grain volumes. For films prepared by sol-gel processing, it is sh own that the switchable polarization is decreased at the grain boundar ies with respect to the grain volumes. The coercive field is clearly i ncreased at the grain boundaries.