M. Chen et al., HIGH-PERFORMANCE MULTILAYER CERAMIC CAPACITOR WITH LOW SINTERING TEMPERATURES, Journal of the Korean Physical Society, 32, 1998, pp. 1210-1213
A low-temperature sintering MLC meeting the EIA temperature coefficien
t code COG has been developed in this work. The dielectric material of
MLC is based on the Bi2O3-ZnO-Nb2O5 ternary system. The dielectric co
nstant of the material is about 100 and the mean particle size is arou
nd 0.5 mu m. Low palladium content Ag-Pd paste was used for internal e
lectrodes. SEM study was used to optimize the sintering condition. Des
tructive physical analysis (DPA) and scanning laser acoustic microscop
e were used to check the internal defects. Fine grain microstructure,
perfect internal structure and high dielectric break-down strength (>1
000 V/mil) were obtained from the MLC. The reliability of MLC was eval
uated by means of highly accelerated life test (HALT) and humidity, st
eady, low voltage test (according to MIL-C-55681D). Failure rate level
M (1.0 % per 1,000 hours) was achieved.