ANALYSIS OF VAN-DE-GRAAFF ION-SOURCE WITH RUTHERFORD BACKSCATTERING SPECTROSCOPY

Citation
C. Narayan et al., ANALYSIS OF VAN-DE-GRAAFF ION-SOURCE WITH RUTHERFORD BACKSCATTERING SPECTROSCOPY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 134(2), 1998, pp. 271-275
Citations number
7
Categorie Soggetti
Instument & Instrumentation","Nuclear Sciences & Tecnology","Physics, Atomic, Molecular & Chemical
ISSN journal
0168583X
Volume
134
Issue
2
Year of publication
1998
Pages
271 - 275
Database
ISI
SICI code
0168-583X(1998)134:2<271:AOVIWR>2.0.ZU;2-N
Abstract
A radio frequency (RF) ion source is utilized at the University of Mas sachusetts Lowell accelerator facility to produce a plasma from which positive ions are extracted and then accelerated. The interior surface of the source becomes contaminated with a dark coating after several hundred hours of usage which reduces the current output of the source. Rutherford backscattering spectroscopy (RES) was employed to analyze the constituents of this coating. Procedures have been carried out to etch chemically this film and to refurbish the ion source. (C) 1998 El sevier Science B.V.