S. Lopez et al., ACID-BASE PROPERTIES OF PASSIVE FILMS ON ALUMINUM II - AN X-RAY PHOTOELECTRON-SPECTROSCOPY AND X-RAY-ABSORPTION NEAR-EDGE STRUCTURE STUDY, Journal of the Electrochemical Society, 145(3), 1998, pp. 829-834
Citations number
21
Categorie Soggetti
Electrochemistry,"Materials Science, Coatings & Films
The adhesion between metals and polymers has attracted much interest i
n recent years due to the increasing use of metal/polymer assemblies,
for example, in the fields of packaging, architecture, and automotive
manufacturing. Among the parameters controlling the adhesion propertie
s of metal/polymer systems, the acid-base properties of both materials
appear to play an important role. Two methods are proposed for assess
ing and quantifying the acido-basicity of passive films on metals: X-r
ay photoelectron spectroscopy (XPS) and X-ray absorption near edge str
ucture (XANES). These techniques were used here to characterize the ac
id-base properties of a large set of passivated aluminum surfaces. Bot
h XPS-monitored Fermi level shift and XANES formic acid and pyridine a
dsorption measurements were found in good agreement in the establishme
nt of a relative basicity scale for the studied surfaces. Moreover, th
e results were cross-validated with those of the novel photoelectroche
mical approach to the acid-base properties of aluminum surfaces presen
ted in Part I.(1)