Am. Wrobel et al., REACTIVITY OF ALKYLSILANES AND ALKYLCARBOSILANES IN ATOMIC HYDROGEN-INDUCED CHEMICAL-VAPOR-DEPOSITION, Journal of the Electrochemical Society, 145(3), 1998, pp. 1060-1065
Citations number
36
Categorie Soggetti
Electrochemistry,"Materials Science, Coatings & Films
A number of alkylsilanes and alkylcarbosilanes of widely different mol
ecular structure are characterized in terms of their ability to the fo
rmation of amorphous hydrogenated silicon-carbon (a-Si:C:H) film in at
omic hydrogen-induced chemical vapor deposition. The compounds contain
ing only the Si-C bonds or four-membered carbosilane rings appear to b
e inactive, while those with the Si-Si or Si-H bonds are capable of th
e a-Si:C:H film-formation. The reactivity of the latter group of compo
unds is characterized by the deposition yield parameter determined at
the constant and variable feeding rates. Based upon the reactivity dat
a a mechanism for the initiation step is proposed.