M. Godlewski et al., OPTICAL-PROPERTIES OF GAN EPILAYERS GROWN ON SI(111) AND SI(001) SUBSTRATES, Materials science & engineering. B, Solid-state materials for advanced technology, 50(1-3), 1997, pp. 113-116
We report the observation of bright photoluminescence (PL) emission fr
om two types of GaN epilayers grown by molecular beam epitaxy (MBE). W
urtzite phase GaN/Si (111) epilayers are grown by gas source MBE proce
ss, whereas cubic phase GaN epilayers are grown on (001) Si covered by
thin SIC film in the process of Si annealing in propane prior to the
GaN growth. PL emissions are identified based on the results of detail
ed PL and time-resolved PL investigations. For the wurtzite phase GaN
we observe an efficient up in the energy transfer from bound to free e
xcitons. This process is explained by a large difference in the PL dec
ay times for two types (free and bound (donor, acceptor)) of excitonic
PL emissions. For cubic phase GaN we confirm recent suggestion that a
ccepters have smaller thermal ionization energies than those in the wu
rtzite phase GaN. (C) 1997 Elsevier Science S.A.