OPTICAL-PROPERTIES OF GAN EPILAYERS GROWN ON SI(111) AND SI(001) SUBSTRATES

Citation
M. Godlewski et al., OPTICAL-PROPERTIES OF GAN EPILAYERS GROWN ON SI(111) AND SI(001) SUBSTRATES, Materials science & engineering. B, Solid-state materials for advanced technology, 50(1-3), 1997, pp. 113-116
Citations number
12
ISSN journal
09215107
Volume
50
Issue
1-3
Year of publication
1997
Pages
113 - 116
Database
ISI
SICI code
0921-5107(1997)50:1-3<113:OOGEGO>2.0.ZU;2-K
Abstract
We report the observation of bright photoluminescence (PL) emission fr om two types of GaN epilayers grown by molecular beam epitaxy (MBE). W urtzite phase GaN/Si (111) epilayers are grown by gas source MBE proce ss, whereas cubic phase GaN epilayers are grown on (001) Si covered by thin SIC film in the process of Si annealing in propane prior to the GaN growth. PL emissions are identified based on the results of detail ed PL and time-resolved PL investigations. For the wurtzite phase GaN we observe an efficient up in the energy transfer from bound to free e xcitons. This process is explained by a large difference in the PL dec ay times for two types (free and bound (donor, acceptor)) of excitonic PL emissions. For cubic phase GaN we confirm recent suggestion that a ccepters have smaller thermal ionization energies than those in the wu rtzite phase GaN. (C) 1997 Elsevier Science S.A.