A. Olszyna et al., PHOTOLUMINESCENCE PROPERTIES OF NANOCRYSTALLINE ALN LAYERS GROWN BY PULSE PLASMA-ASSISTED CVD, Materials science & engineering. B, Solid-state materials for advanced technology, 50(1-3), 1997, pp. 170-173
In this work, results of photoluminescence and absorption measurements
on pulse plasma assisted CVD layers of AlN are presented. We studied
nanocrystalline layers grown on silicon substrate at a temperature of
300 K. The efficient photoluminescence of nanocrystalline AlN layers,
obtained under non optimal conditions, i.e. relatively low excitation
energy, seems to be promising for light emitting applications of this
material. (C) 1997 Elsevier Science S.A.