STUDY OF SECONDARY-ELECTRON EMISSION FROM VARIOUS TARGETS DUE TO 100 MEV SI7+ BEAM

The total secondary electron yields Y were measured for 100 MeV Si7+ i ons on Be, Al, Si, Ni, Ag and Au as a function of the incident angle o f projectile ranging from 0 degrees to 65 degrees. In order to compare the angular dependence of the electron yield for Si7+ ions using diff erent targets, the experimental curves were fitted by the empirical re lation of the form Y(theta) = Y(0)(cos theta)-f, where theta is the an gle of incidence, Y(0) is the yield at normal incidence (theta = 0 deg rees) and f is a fitting parameter. The value off varied from 0.69 to 1.52. The Z dependence of Y(0) for various targets (Z = 4 to 79) were also observed. (C) 1998 Elsevier Science Ltd. All rights reserved.