The clustering dynamics of SiO2-containing negative ion clusters gener
ated from ultrafine amorphous SiO2 powders with high specific surface
area is investigated by XeCl excimer laser ablation time-of-flight mas
s spectrometry (TOF-MS). From the evolution of the mass spectra with t
he delay time and the number of laser irradiation shots, the key roles
played by OH and OH- fragments from the surface silanol groups in the
formation of SiO2-containing negative ion clusters are discussed. (C)
1997 Elsevier Science B.V.