L. Braginsky et V. Shklover, INFLUENCE OF INTERFACE STRUCTURE ON TRANSVERSAL ELECTRON-TRANSPORT, Solid state communications, 105(11), 1998, pp. 701-704
The influence of the sharpness of the interface on the electron transp
ort is investigated. The simple one-dimensional tight-binding model, w
hich allows the consideration of an interface with arbitrary sharpness
, is examined. It is shown that an interface with size much larger tha
n a(lambda/a)(1/3) (where a is the lattice constant and lambda is the
electron wavelength) can be considered as smooth. This means that the
interface transmittance for the electron crossing is of the order of u
nity. In the opposite limiting case of the sharp interface, the transm
ittance becomes suppressed as (a/lambda)(2). (C) 1998 Elsevier Science
Ltd.