4D-4F AND 3D-4F RESONANT PHOTOEMISSION OF TMX (X = S, SE, TE)

Citation
S. Kimura et al., 4D-4F AND 3D-4F RESONANT PHOTOEMISSION OF TMX (X = S, SE, TE), Journal of magnetism and magnetic materials, 177, 1998, pp. 349-350
Citations number
11
Categorie Soggetti
Material Science","Physics, Condensed Matter
ISSN journal
03048853
Volume
177
Year of publication
1998
Part
1
Pages
349 - 350
Database
ISI
SICI code
0304-8853(1998)177:<349:4A3RPO>2.0.ZU;2-V
Abstract
The electronic structures of thulium monochalcogenides (TmX; X = S, Se , Te) were studied both experimentally and theoretically using resonan t photoemission around the Tm 4d and 3d absorption edges. The fundamen tal electronic structures and the mean valences are analyzed. (C) 1998 Elsevier Science B.V. All rights reserved.