4D-4F AND 3D-4F RESONANT PHOTOEMISSION OF TMX (X = S, SE, TE)
Citation
S. Kimura et al., 4D-4F AND 3D-4F RESONANT PHOTOEMISSION OF TMX (X = S, SE, TE), Journal of magnetism and magnetic materials, 177, 1998, pp. 349-350
Categorie Soggetti
Material Science","Physics, Condensed Matter
SICI code
0304-8853(1998)177:<349:4A3RPO>2.0.ZU;2-V
Abstract
The electronic structures of thulium monochalcogenides (TmX; X = S, Se
, Te) were studied both experimentally and theoretically using resonan
t photoemission around the Tm 4d and 3d absorption edges. The fundamen
tal electronic structures and the mean valences are analyzed. (C) 1998
Elsevier Science B.V. All rights reserved.