A comparative study of structure and GMR for sputtered Fe/Mo multilaye
r films (MLF) shows that an interface roughness to a certain extent is
in favour of GMR, The Fe buffer layer increases GMR by improving the
coherent crystallite growing and increasing interface roughness withou
t changing the crystallite orientation, The MLF with thinner Mo-layer
exhibits a weak temperature dependence of GMR which can be ascribed to
the relatively larger contribution from the impurity and structural i
mperfection scatterings at interfaces as compared with the phonon scat
tering. (C) 1998 Elsevier Science B.V. All rights reserved.