SIZE SELECTION BY CLUSTER DEFLECTION IN AN ELECTRIC-FIELD

Citation
Ac. Xenoulis et al., SIZE SELECTION BY CLUSTER DEFLECTION IN AN ELECTRIC-FIELD, Nanostructured materials, 8(7), 1997, pp. 771-784
Citations number
10
Journal title
ISSN journal
09659773
Volume
8
Issue
7
Year of publication
1997
Pages
771 - 784
Database
ISI
SICI code
0965-9773(1997)8:7<771:SSBCDI>2.0.ZU;2-6
Abstract
Deflection by an electric field has been tested as a means to deposit size selected clusters. A hollow-cathode, glow-discharge, source has b een used for the production of Cu clusters in the size range between 4 and 38 nm, while afield emission scanning microscope has been used fo r HREM investigation of the size and morphology of clusters supported on Al foil. The deflected negative clusters demonstrate size selection as a function of displacement while the positive do not follow the sa me displacement function. Size selection is also observed in the neutr al clusters, with the heaviest clusters deposited at the center of the undeflected beam spot. Implications concerning the synthesis of clust er-composed, nanostructured materials are discussed. (C) 1998 Acta Met allurgica Inc.