TEM INVESTIGATION OF THE MICROSTRUCTURE AND DEFECTS OF CUZR MARTENSITE - PART II - PLANAR DEFECTS

Citation
Jw. Seo et D. Schryvers, TEM INVESTIGATION OF THE MICROSTRUCTURE AND DEFECTS OF CUZR MARTENSITE - PART II - PLANAR DEFECTS, Acta materialia, 46(4), 1998, pp. 1177-1183
Citations number
7
Categorie Soggetti
Material Science","Metallurgy & Metallurigical Engineering
Journal title
ISSN journal
13596454
Volume
46
Issue
4
Year of publication
1998
Pages
1177 - 1183
Database
ISI
SICI code
1359-6454(1998)46:4<1177:TIOTMA>2.0.ZU;2-9
Abstract
In Part II of these two sequential papers the details of two different planar defects are presented and discussed in view of their relation with the martensitic transformation. It is shown that the lattice disp lacements and habit planes of the defects can be explained by assuming non-conservative anti-phase boundaries existing in the parent B2 phas e, that is, prior to martensitic transformation. The main difference b etween both defects is the sequence of shuffled (001) planes which rem ains unchanged in the first type but skips one plane in the second typ e. The microtwin sequence is also clearly affected by the second type. (C) 1998 Acta Metallurgica Inc.