Jw. Seo et D. Schryvers, TEM INVESTIGATION OF THE MICROSTRUCTURE AND DEFECTS OF CUZR MARTENSITE - PART II - PLANAR DEFECTS, Acta materialia, 46(4), 1998, pp. 1177-1183
Citations number
7
Categorie Soggetti
Material Science","Metallurgy & Metallurigical Engineering
In Part II of these two sequential papers the details of two different
planar defects are presented and discussed in view of their relation
with the martensitic transformation. It is shown that the lattice disp
lacements and habit planes of the defects can be explained by assuming
non-conservative anti-phase boundaries existing in the parent B2 phas
e, that is, prior to martensitic transformation. The main difference b
etween both defects is the sequence of shuffled (001) planes which rem
ains unchanged in the first type but skips one plane in the second typ
e. The microtwin sequence is also clearly affected by the second type.
(C) 1998 Acta Metallurgica Inc.