M. Yamaguchi et al., CORRELATIONS FOR DAMAGE IN DIFFUSED-JUNCTION INP SOLAR-CELLS INDUCED BY ELECTRON AND PROTON IRRADIATION, Journal of applied physics, 81(9), 1997, pp. 6013-6018
The damage to diffused-junction n(+)-p InP solar cells induced by elec
tron and proton irradiations over a wide range of energy from 0.5 to 3
MeV and 0.015 to 20 MeV, respectively, has been examined. The experim
ental electron and proton damage coefficients have been analyzed in te
rms of displacement damage dose, which is the product of the particle
fluence and the calculated nonionizing energy loss [G. P. Summers, E.
A. Burke, R. Shapiro, S. R. Messenger, and R. J. Waiters, IEEE Trans.
Nucl. Sci. 40, 1300 (1993).] Degradation of InP cells due to irradiati
on with electrons and protons with energies of more than 0.5 MeV show
a single curve as a function of displacement damage dose. Based on the
deep-level transient spectroscopy analysis, damage equivalence betwee
n electron and proton irradiation is discussed. InP solar cells are co
nfirmed to be substantially more radiation resistant than Si and GaAs-
on-Ge cells. (C) 1997 American Institute of Physics.