EMISSIVITY OF LIQUID SILICON IN VISIBLE AND INFRARED REGIONS

Citation
E. Takasuka et al., EMISSIVITY OF LIQUID SILICON IN VISIBLE AND INFRARED REGIONS, Journal of applied physics, 81(9), 1997, pp. 6384-6389
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
81
Issue
9
Year of publication
1997
Pages
6384 - 6389
Database
ISI
SICI code
0021-8979(1997)81:9<6384:EOLSIV>2.0.ZU;2-X
Abstract
Normal spectral emissivity of Si melt in visible and infrared regions was determined by the direct measurement of thermal radiations from th e melt and a blackbody cavity which was located close to the melt. The spectral emissivity slightly decreases with wavelength. The emissivit y slightly changes with temperature, The spectral emissivity values in visible and in infrared region are 0.27 and 0.21, respectively. The w avelength dependence of the emissivity can be interpreted by a dielect ric response of free electrons in the melt. (C) 1997 American Institut e of Physics.