Normal spectral emissivity of Si melt in visible and infrared regions
was determined by the direct measurement of thermal radiations from th
e melt and a blackbody cavity which was located close to the melt. The
spectral emissivity slightly decreases with wavelength. The emissivit
y slightly changes with temperature, The spectral emissivity values in
visible and in infrared region are 0.27 and 0.21, respectively. The w
avelength dependence of the emissivity can be interpreted by a dielect
ric response of free electrons in the melt. (C) 1997 American Institut
e of Physics.