CONTROLLED GROWTH OF SIO2 TUNNEL BARRIER AND CRYSTALLINE SI QUANTUM-WELLS FOR SI RESONANT-TUNNELING DIODES

Citation
Y. Wei et al., CONTROLLED GROWTH OF SIO2 TUNNEL BARRIER AND CRYSTALLINE SI QUANTUM-WELLS FOR SI RESONANT-TUNNELING DIODES, Journal of applied physics, 81(9), 1997, pp. 6415-6424
Citations number
31
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
81
Issue
9
Year of publication
1997
Pages
6415 - 6424
Database
ISI
SICI code
0021-8979(1997)81:9<6415:CGOSTB>2.0.ZU;2-D
Abstract
Two methods for producing Si-oxide barriers upon which crystalline Si layers can be grown are presented. One method entails oxide island nuc leation on a clean vicinal Si(001) surface. The second method makes us e of void formation in ultrathin oxides on the Si(100) surface at elev ated temperatures. Either method results in an oxide barrier which is porous and the exposed Si within these pores can serve as a way to see d c-Si overgrowth. We demonstrate that it is feasible to grow crystall ine Si overlayers on top of such porous oxide barriers, while on the c ontinuous Si-oxide surface, only amorphous or nanocrystalline Si layer overgrowth can be achieved, The controlled oxide growth and Si overgr owth on the oxide can find possible applications in Si-based resonant tunneling devices, optoelectronics, and other Si-based nanoelectronics . (C) 1997 American Institute of Physics.