In this article, we report on the characterization of a photovoltaic d
etector based on an n-type GaN Schottky barrier. We first present the
photovoltaic responsivity above the gap. Its spectrum is explained by
the combined effects of absorption and diffusion. The hole diffusion l
ength is estimated to be in the 0.1 mu m range with a numerical model.
The photoresponse below the gap is also investigated and it is shown
that the current generated by the internal photoemission is the major
contribution to the photocurrent at reverse biases at 80 K. At room te
mperature, an additional component to the photocurrent is clearly demo
nstrated and identified. This extra current stems from the existence o
f traps. Several spectroscopy techniques are used to characterize thos
e traps. The supplementary current emitted from the traps in the deple
tion region accounts for the spectral and the temporal behavior of the
Schottky photodetector at room temperature. (C) 1997 American Institu
te of Physics.