INTERFERENCE IN LIGHT-SCATTERING FROM SLIGHTLY ROUGH DIELECTRIC LAYERS

Citation
Ys. Kaganovskii et al., INTERFERENCE IN LIGHT-SCATTERING FROM SLIGHTLY ROUGH DIELECTRIC LAYERS, Optics letters, 23(5), 1998, pp. 316-318
Citations number
9
Categorie Soggetti
Optics
Journal title
ISSN journal
01469592
Volume
23
Issue
5
Year of publication
1998
Pages
316 - 318
Database
ISI
SICI code
0146-9592(1998)23:5<316:IILFSR>2.0.ZU;2-F
Abstract
The scattering of light from a slightly rough surface overlying a refl ecting surface is investigated. It is shown that the long-scale compon ent of the roughness spectrum plays a critical role in the scattering patterns obtained. The scattered interference patterns are critically dependent on small variation of the rms height of the long-scale compo nent of the roughness. Conventional perturbation theory is found to be invalid in cases in which interference phenomena in the scattering ar e of importance. A model is proposed that quantitatively describes the measured angular intensity distributions. (C) 1998 Optical Society of America.