3D MICROMAGNETIC MODEL OF FINITE LINEAR DEFECTS IN ANTIFERROMAGNETICALLY COUPLED MULTILAYERS

A 3D micromagnetic model for the study of the influence of finite line ar structural defects on the remagnetization processes in antiferromag netically coupled multilayers is presented (such defects are assumed t o induce the local ferromagnetic coupling between adjacent magnetic la yers). Some new features of 360 degrees-domain walls predicted by the previous model where the defect was assumed to be infinitely long are observed, It is shown that the annihilation field of such walls strong ly depends on the defect configuration, whereas the wall width is dete rmined by the parameters of the undisturbed layer only. Consequences f or the comparison of our results with experimental data are drawn. (C) 1998 Elsevier Science B.V. All rights reserved.