Tk. Kwok et al., INTERPRETATION OF INPLANE AND OUT-OF-PLANE ANISOTROPIC SURFACE-INTERFACE REFLECTANCE AND TRANSMITTANCE DIFFERENCE SPECTROSCOPY, Journal of the Optical Society of America. B, Optical physics, 15(3), 1998, pp. 1198-1204
A numerical method developed previously [J. Appl. Phys. 80, 4621 (1996
)] has been extended to simulate the nonnormal-incidence reflectance-d
ifference spectroscopy and transmittance-difference spectroscopy spect
ra of biaxial anisotropic (epsilon(x) not equal epsilon(y) not equal e
psilon(z)) multilayer systems with finite thickness. It is demonstrate
d that, when the principal axes of the anisotropy layer are at certain
orientations, a reflectance-difference spectrum can be separated into
two spectra, namely, an in-plane anisotropic spectrum and an out-of-p
lane anisotropic spectrum. It is shown that the separation is valid fo
r large in-plane anisotropy, i.e., \epsilon(x) - epsilon(y)\ approxima
te to \epsilon(x)\, and an incident angle of less than or equal to 20
degrees. (C) 1998 Optical Society of America [S0740-3224(98)01203-X].