FLUX-CREEP MECHANISM OF CRITICAL-CURRENT LIMITATION IN TL-BASED THIN-FILM MICROSTRIPS

Authors
STRBIK V CHROMIK S JERGEL M MACHAJDIK D BENACKA S KOBZEV AP
Citation
V. Strbik et al., FLUX-CREEP MECHANISM OF CRITICAL-CURRENT LIMITATION IN TL-BASED THIN-FILM MICROSTRIPS, Journal of superconductivity, 11(1), 1998, pp. 65-66
Citations number
9
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter
Journal title
Journal of superconductivity → ACNP
ISSN journal
08961107
Volume
11
Issue
1
Year of publication
1998
Pages
65 - 66
Database
ISI
SICI code
0896-1107(1998)11:1<65:FMOCLI>2.0.ZU;2-0
Abstract
Superconducting Tl-Ba-Ca-Cu-O thin film microstrips were prepared on M gO substrates by thallination of the lift-off patterned Ba-Ca-Cu-O pre cursor films. The highest zero-resistance critical temperare T-co of m icrostrips was 94 K. From the critical current vs. temperature depende nce two various critical current limiting mechanisms were distinguishe d.