LASER-ABLATION TIME-OF-FLIGHT MASS-SPECTROMETRIC PROBING OF THE SURFACE-STATES OF SIO2-BASED POROUS MATERIALS

Authors
XU C LONG Y ZHANG R ZHAO L QIAN S LI Y
Citation
C. Xu et al., LASER-ABLATION TIME-OF-FLIGHT MASS-SPECTROMETRIC PROBING OF THE SURFACE-STATES OF SIO2-BASED POROUS MATERIALS, Applied physics A: Materials science & processing, 66(1), 1998, pp. 99-102
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
Applied physics A: Materials science & processing → ACNP
ISSN journal
09478396
Volume
66
Issue
1
Year of publication
1998
Pages
99 - 102
Database
ISI
SICI code
0947-8396(1998)66:1<99:LTMPOT>2.0.ZU;2-9
Abstract
SiO2-based materials of different porosity and surface states have bee n studied by time-of-flight mass spectrometry (TOF-MS) under 308 nm ex cimer laser ablation. Sequences of SiO2-based negative ion clusters [( SiO2)(n)X](-) are observed and variations of their abundance distribut ions with sample properties ale studied. The unique roles of surface s tates in cluster formation are discussed.