Dj. Hall et al., ANALYSIS OF STRAINED INGAAS INGAASP SINGLE QUANTUM-WELLS USING ROOM-TEMPERATURE PHOTOREFLECTANCE/, Semiconductor science and technology, 13(3), 1998, pp. 302-309
Room temperature photoreflectance (PR) has been performed on five nomi
nally 90 Angstrom wide ln(1-x)Ga(x)As undoped single quantum well (QW)
structures in In0.77Ga0.23As0.49P0.51 barriers, lattice matched to an
InP substrate. The nominal QW Ga composition varies between x = 0.47
and x = 0.68, corresponding to tensile strains between zero and 1.47%,
respectively. Room temperature photoluminescence measurements are als
o performed on the same position on the sample as the PR, Allowed and
forbidden interband QW transition energies, given by least-squares fit
ting to the PR, are found to agree well with theoretical predictions b
ased on an effective mass formalism, including excitonic binding energ
ies and quantum-confined Stark effects. In achieving this agreement, v
alues for the QW composition, thickness and band offset are determined
by refining their nominal values. The conduction band offsets are fou
nd to range from 0.35 to 0.14 for tensile strains between zero and 1.4
0%. The energies of the ground state light-and heavy-hole QW transitio
ns increase roughly linearly with tensile strain.