A thin film formation of MnSi and MnSi1.7 on a silicon substrate throu
gh solid phase reaction has been studied, where MnSi1.7 is one of the
few semiconducting silicides, while MnSi is a metallic one. The growth
process and electronic states of manganese silicides with composition
of MnSi and MnSi1.7 are investigated by several methods, including so
ft X-ray emission spectroscopy.