N. Jiang et al., STRUCTURAL-ANALYSIS OF ION-IMPLANTED CHEMICAL-VAPOR-DEPOSITED DIAMONDBY TRANSMISSION ELECTRON-MICROSCOPE, Applied surface science, 114, 1997, pp. 254-258
Citations number
16
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
A transmission electron microscope (TEM) study of ion-implanted chemic
al-vapor-deposited (CVD) diamond is presented. CVD diamond used for tr
ansmission electron microscope observation was directly deposited onto
Mo TEM grids. As-deposited specimens were irradiated by C (100 keV) i
ons at room temperature with a wide range of implantation doses (10(12
)-10(17)/cm(2)). Transmission electron diffraction (TED) patterns indi
cate that there exists a critical dose (D-c) for the onset of amorphiz
ation of CVD diamond as a result of ion induced damage and the value o
f critical dose is confirmed to be about 3 x 10(15)/cm(2). The ion-Ind
uced transformation process is clearly revealed by high resolution ele
ctron microscope (HREM) images. For a higher dose implantation (7 X 10
(15)/cm(2)) a large amount of diamond phase is transformed into amorph
ous carbon and many tiny misoriented diamond blocks are found to be le
ft in the amorphous solid. The average size of these misoriented diamo
nd blocks is only about 1-2 nm. Further bombardment (10(17)/cm(2)) alm
ost kills all of the diamond phase within the irradiated volume and mo
reover leads to local formation of micropolycrystalline graphite.