POINT-ON-LINE COINCIDENCE IN EPITAXIAL-GROWTH OF CUPCCL16 ON GRAPHITE

Citation
S. Irie et al., POINT-ON-LINE COINCIDENCE IN EPITAXIAL-GROWTH OF CUPCCL16 ON GRAPHITE, Applied surface science, 114, 1997, pp. 310-315
Citations number
6
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
114
Year of publication
1997
Pages
310 - 315
Database
ISI
SICI code
0169-4332(1997)114:<310:PCIEOC>2.0.ZU;2-#
Abstract
Epitaxial growth of perchloro-copper-phthalocyanine (CuPcCl16) on grap hite was studied by STM and TEM. The crystals grew epitaxially with tw o slightly different orientations on the graphite surface, Tile corres ponding orientations were also observed in a monolayer of CuPcCl16 by STM. By detailed analysis of the moire-like pattern in the STM images, these orientations are interpreted as being consistent with a 'point- on-line coincidence' epitaxy. In order to realize the exact paint-on-l ine coincidence for the respective orientation, the unit cell dimensio ns of the monolayer were slightly distorted at each orientation, altho ugh they are almost the same as the monoclinic structure of the thin f ilm determined by TEM.