CHARACTERIZING REACTIONS TO FABRICATE THIN-FILMS OF CHARGE-TRANSFER COMPLEXES BY SYNCHROTRON PHOTOELECTRON-SPECTROSCOPY - A CASE-STUDY OF DCNQI-CU

Authors
SHIMADA T MOCHIDA M KOMA A
Citation
T. Shimada et al., CHARACTERIZING REACTIONS TO FABRICATE THIN-FILMS OF CHARGE-TRANSFER COMPLEXES BY SYNCHROTRON PHOTOELECTRON-SPECTROSCOPY - A CASE-STUDY OF DCNQI-CU, Applied surface science, 114, 1997, pp. 322-325
Citations number
6
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
Applied surface science → ACNP
ISSN journal
01694332
Volume
114
Year of publication
1997
Pages
322 - 325
Database
ISI
SICI code
0169-4332(1997)114:<322:CRTFTO>2.0.ZU;2-I
Abstract
Ultraviolet photoelectron spectroscopy with various photon energies us ing synchrotron radiation was used to characterize chemical reactions associated with thin film growth of organic charge transfer complex (D Me-DCNQI)(2)Cu. Other molecular systems H2Pc, CuPc and C-60 were also studied to clarify the origin of the systematic relation between the s pectra and the incident photon energy. Characteristic photon energy de pendence of the photo-ionization cross section of molecular orbitals i s useful to analyze the intermolecular reactions.