K. Uesugi et al., ATOMIC-FORCE MICROSCOPY STUDY OF ZNSE GAAS HETEROEPITAXY PROCESSES BYMETALORGANIC VAPOR-PHASE EPITAXY/, Applied surface science, 114, 1997, pp. 371-376
Citations number
8
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
We investigate the initial growth of ZnSe on (001) GaAs in metalorgani
c vapour phase epitaxy using atomic force microscopy, X-ray diffractio
n, and photoluminescence, GaAs surfaces become atomically fiat after t
hermal cleaning at a temperature of 620-750 degrees C. The property of
ZnSe films is critically dependent on the GaAs surface preparation an
d the flow rate ratio of Se to Zn. The simultaneous As flow during the
rmal cleaning is effective to prow high-quality ZnSe films. The growth
processes at the initial stages of heteroepitaxy of ZnSe on GaAs are
dominated by the two-dimensional growth mode for Zn-rich growth condit
ions, while those are dominated by the three-dimensional growth mode a
s the Se flow, rate increased. The optimum condition for the ZnSe opti
cal quality is different from that for the initial two-dimensional gro
wth. grow atomically flat ZnSe films with better optical quality. We d
emonstrate that the 2-step growth is effective to grow atomically flat
ZnSe films with better optical quality.