DEPENDENCE OF ELECTRICAL-RESISTIVITY ON SURFACE-TOPOGRAPHY OF MBE-GROWN PT FILM

Authors
NISHIKAWA K YAMAMOTO M KINGETSU T
Citation
K. Nishikawa et al., DEPENDENCE OF ELECTRICAL-RESISTIVITY ON SURFACE-TOPOGRAPHY OF MBE-GROWN PT FILM, Applied surface science, 114, 1997, pp. 412-416
Citations number
9
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
Applied surface science → ACNP
ISSN journal
01694332
Volume
114
Year of publication
1997
Pages
412 - 416
Database
ISI
SICI code
0169-4332(1997)114:<412:DOEOSO>2.0.ZU;2-H
Abstract
Surface topography of MBE-grown Pr film was investigated with scanning tunneling microscopy. On the other hand, electrical resistivity of th e Pt film in Pt/Cu/Si specimen was measured using a proposed analytica l model. Comparing the electrical resistivity change with the surface topography change, dependence of electrical resistivity on surface top ography was clearly demonstrated.