Ns. Maslova et al., SCANNING TUNNELING SPECTROSCOPY OF CHARGE EFFECTS ON SEMICONDUCTOR SURFACES AND ATOMIC CLUSTERS, JETP letters, 67(2), 1998, pp. 146-152
We have used scanning tunneling microscopy and scanning tunneling spec
troscopy at liquid helium temperature to study the electronic structur
e of in situ cleaved, (110) oriented surfaces of InAs single crystals.
Both unperturbed, atomically flat areas and areas with an atomic-size
defect cluster have been investigated. We show that the anomalous beh
avior of the local tunneling conductivity, which indicates a pronounce
d enhancement of the semiconductor band gap for the flat areas, is con
sistent with band bending induced by charges localized at the apex of
the tip. Atomic-size defect clusters contain additional charges which
modify the band bending; this explains the different behavior of the t
unneling conductivity near the defect cluster. The experimentally obse
rved oscillations of the tunneling conductivity near the band gap edge
s can be directly related to resonant tunneling through quantized surf
ace states which appear because of the band bending. (C) 1998 American
Institute of Physics.