SCANNING TUNNELING SPECTROSCOPY OF CHARGE EFFECTS ON SEMICONDUCTOR SURFACES AND ATOMIC CLUSTERS

Citation
Ns. Maslova et al., SCANNING TUNNELING SPECTROSCOPY OF CHARGE EFFECTS ON SEMICONDUCTOR SURFACES AND ATOMIC CLUSTERS, JETP letters, 67(2), 1998, pp. 146-152
Citations number
19
Categorie Soggetti
Physics
Journal title
ISSN journal
00213640
Volume
67
Issue
2
Year of publication
1998
Pages
146 - 152
Database
ISI
SICI code
0021-3640(1998)67:2<146:STSOCE>2.0.ZU;2-R
Abstract
We have used scanning tunneling microscopy and scanning tunneling spec troscopy at liquid helium temperature to study the electronic structur e of in situ cleaved, (110) oriented surfaces of InAs single crystals. Both unperturbed, atomically flat areas and areas with an atomic-size defect cluster have been investigated. We show that the anomalous beh avior of the local tunneling conductivity, which indicates a pronounce d enhancement of the semiconductor band gap for the flat areas, is con sistent with band bending induced by charges localized at the apex of the tip. Atomic-size defect clusters contain additional charges which modify the band bending; this explains the different behavior of the t unneling conductivity near the defect cluster. The experimentally obse rved oscillations of the tunneling conductivity near the band gap edge s can be directly related to resonant tunneling through quantized surf ace states which appear because of the band bending. (C) 1998 American Institute of Physics.