N. Mustapha et Rp. Howson, COMPARISON OF UNBALANCED MAGNETRON SPUTTERING AND FILTERED ARE EVAPORATION FOR THE PREPARATION OF FILMS ONTO INSULATING SUBSTRATES, Vacuum, 49(2), 1998, pp. 75-79
The performance of a steered-are evaporation source is compared to the
unbalanced magnetron, as to its performance in the preparation of ele
mental and reactively produced compound films. Materials investigated
include Al, Ti, Cu, TiN, and Al2O3. In reactive processing the ionised
metal constituent provided by are evaporation appears to make the kin
etics of the substrate reaction process much more simple than those re
quired with argon-ion-assisted sputter processes where a careful balan
ce must be maintained. If has been found that in the case of TiN bette
r quality films could be prepared onto room temperature substrates by
are evaporation than by sputtering, while for Al2O3 the are-deposited
films show good adhesion, good optical properties and were nearly stoi
chiometric with a refractive index of 1.66. (C) 1998 Elsevier Science
Ltd.