Methane concentrations of 8-16% were applied to grow diamond by hot fi
lament chemical vapour deposition. To study the nucleation behaviour w
ith high methane concentrations, silicon substrates were polished with
diamond and aluminum oxide. Atomic force microscopy (AFM) was used to
examine the topography of the grown surface. Diamond nuclei were obse
rved with density of 5 x 10(7) - 5 x 10(8) cm(-2), after 3-5 min depos
ition, on diamond seeded substrate but not on Al2O3 polished surface.
Instead of growing along the scratches induced by polishing, diamond n
uclei developed directly on the matrix of an amorphous carbon layer co
nfirmed by transmission electron microscopy. (C) 1998 Elsevier Science
S.A.