CONFOCAL RAMAN STRAIN MAPPING OF ISOLATED SINGLE CVD DIAMOND CRYSTALS

Citation
Kw. Nugent et S. Prawer, CONFOCAL RAMAN STRAIN MAPPING OF ISOLATED SINGLE CVD DIAMOND CRYSTALS, DIAMOND AND RELATED MATERIALS, 7(2-5), 1998, pp. 215-221
Citations number
10
Categorie Soggetti
Material Science
ISSN journal
09259635
Volume
7
Issue
2-5
Year of publication
1998
Pages
215 - 221
Database
ISI
SICI code
0925-9635(1998)7:2-5<215:CRSMOI>2.0.ZU;2-2
Abstract
PI number of isolated single CVD (chemical vapour deposition) diamond crystals were mapped using confocal Raman microscopy at a spatial reso lution of 1 mu m. Both square and triangular faceted crystals were inc luded. It was found that, in general, regions of both types of crystal s which corresponded to (111) growth sectors showed an overall shift o f the diamond peak to low wavenumber, while the regions which correspo nded to (100) growth sectors showed a shift to high wavenumber. This i s interpreted as deriving from the presence of high concentrations of defects in the (111) growth sectors resulting in an overall tensile st rain in these regions, and a compressive stress where these low densit y regions border the higher quality diamond from (100) growth sectors. (C) 1998 Elsevier Science S.A.