We present new developments in the preparation of semiconducting cubic
boron nitride. The thin films were grown on (100) silicon substrates
using electron cyclotron resonance (ECR) ion-assisted magnetron sputte
ring with the kinetic energy of the incident nitrogen ions controlled
by a de substrate bias. Using this technique we have been able to grow
thick (up to 2 mu m) boron nitride films containing 100% of the cubic
phase. We have found that the relatively high nitrogen ion energy (si
milar to 100 eV), required to nucleate the cubic phase, can be reduced
substantially (to similar to 60 eV) once the cubic phase is formed, l
eading to reduced film stress, larger grain size (similar to 1000 Angs
trom) and improved adhesion. The films have p-type conductivity, The c
arrier activation energy is 60 meV and we have observed Hall mobilitie
s of 500 cm(2) V-1 s(-1) at n(a) approximate to(5 x 10(18) cm(-3)). (C
) 1998 Elsevier Science S.A.