COMPARATIVE-STUDY OF THE OPTICAL AND STRUCTURAL-PROPERTIES OF A-C-H FILMS DEPOSITED BY CONVENTIONAL DIODE AND MICROWAVE ECR ASSISTED RF PLASMA METHODS

Citation
A. Zeinert et al., COMPARATIVE-STUDY OF THE OPTICAL AND STRUCTURAL-PROPERTIES OF A-C-H FILMS DEPOSITED BY CONVENTIONAL DIODE AND MICROWAVE ECR ASSISTED RF PLASMA METHODS, DIAMOND AND RELATED MATERIALS, 7(2-5), 1998, pp. 486-490
Citations number
10
Categorie Soggetti
Material Science
ISSN journal
09259635
Volume
7
Issue
2-5
Year of publication
1998
Pages
486 - 490
Database
ISI
SICI code
0925-9635(1998)7:2-5<486:COTOAS>2.0.ZU;2-1
Abstract
We have compared the influence of the hydrogen bonding configuration a nd content on the optoelectronic properties and structure of two serie s of diamond-like hydrogenated amorphous carbon films (a-C:H) deposite d under different plasma conditions, respectively, by conventional dio de and microwave electron cyclotron resonance (MWECR) assisted radio f requency (rf) plasma decomposition of pure methane. A combination of i nfra-red (IR) and optical absorption measurements have been performed on the samples in their as-deposited state and after successive isochr onal annealing up to 650 degrees C. These measurements are correlated with thermal disorption mass spectroscopy experiments (TDMS) (up to 90 0 degrees C), The results as a whale indicate that the MWECR assisted rf plasma films are more dense than those deposited by conventional rf plasma, and that they exhibit different behaviour upon annealing (up to 900 degrees C). (C) 1998 Elsevier Science S.A.