AN INSIGHT INTO THE MECHANISM OF SURFACE CONDUCTIVITY IN THIN-FILM DIAMOND

Citation
Hj. Looi et al., AN INSIGHT INTO THE MECHANISM OF SURFACE CONDUCTIVITY IN THIN-FILM DIAMOND, DIAMOND AND RELATED MATERIALS, 7(2-5), 1998, pp. 550-555
Citations number
22
Categorie Soggetti
Material Science
ISSN journal
09259635
Volume
7
Issue
2-5
Year of publication
1998
Pages
550 - 555
Database
ISI
SICI code
0925-9635(1998)7:2-5<550:AIITMO>2.0.ZU;2-V
Abstract
Diamond containing hydrogen at or near the surface displays p-type con ductivity. The origin of this effect has been controversial. We have u sed I-V, Hall effect, SIMS, Raman, UPS and XPS to study hydrogenated p olycrystalline CVD diamond films. The direct formation of acceptor sta tes by hydrogen, which resides within the top 20 nm of the film, is th e origin of the carriers present rather than surface band bending. Up to 10(19) holes cm(-3) can be measured and mobilities as high as 70 cm (2) Vs(-1) recorded. H-termination of the surface is important for the formation of high quality metal-diamond interfaces. (C) 1998 Elsevier Science S.A.