SOME PHYSICAL-PROPERTIES OF VACUUM-DEPOSITED CD0.5ZN0.5TE TERNARY SOLID-SOLUTION

Vacuum deposited Cd0.5Zn0.5Te thin films of different thicknesses (161 -450 nm) prepared by thermal evaporation in vacuum, were found to corr espond to a polycrystalline cubic crystal system and exhibited p-type semiconducting behaviour. Film optical constants were determined from transmittance and reflectance measurements at normal light incidence i n the spectral range (500-2000 nm). It was found that both the refract ive index (n) and the absorption index (k) are independent of the film thickness. Analysis of n(lambda) shows normal dispersion. An energy g ap of 1.72 eV was determined and attributed to allowed direct optical transitions. (C) 1998 Elsevier Science Ltd. All rights reserved.