Jj. Benitez et al., STUDY OF ALUMINOPHOSPHATE OXYNITRIDE (ALPON) MATERIALS BY X-RAY PHOTOELECTRON (XPS) AND DIFFUSE-REFLECTANCE FOURIER-TRANSFORM IR SPECTROSCOPY (DRIFTS), Journal of materials chemistry, 8(3), 1998, pp. 687-691
A series of amorphous aluminophosphate oxynitrides (AlPON) have been o
btained by nitridation of AlPO4 in a tubular furnace at 750 degrees C
under a dry NH3 stream. Bulk nitrogen content is controlled by the rea
ction time and quantified by alkaline digestion with molten KOH. Sampl
es have been analysed by X-ray photoelectron spectroscopy (XPS) and di
ffuse reflectance IR spectroscopy (DRIFTS). XPS results indicate that
nitrogen selectively replaces oxygen atoms bonded to phosphorus in the
[PO4] tetrahedra of AlPO4 leading to a mixture of [POxN4-x] units in
AlPON. Simultaneously, an Al2O3-type phase develops. Compositions obta
ined by XPS are in good agreement with those expected from bulk formul
ation. Nitridation reaction starts at the surface of AlPO4 by breaking
P-O bonds and generating terminal P-NH2. Once surface P-NH2 saturatio
n is achieved (above 3.6 mass% N), bulk nitridation occurs. In nitroge
n saturated AlPON samples (ca. 20 mass% N) the presence of a surface P
3N5 phase is proposed to be responsible for the slight surface nitroge
n enrichment observed. The presence of structural (-NH-) groups, isoel
ectronic to (-O-), and their growing concentration with nitridation ti
me have been detected by DRIFTS. Diffuse reflectance IR spectroscopy a
lso suggests the presence of cyclic (P-N-P) structures.