Layered polysilane (Si6H6) and its thermolysis have been studied using
FTIR spectroscopy, thermogravimetry/differential thermal analysis, ma
ss spectrometry, electron paramagnetic resonance, Si K-edge absorption
and photoluminescence spectroscopy. It is found that cross-linking be
tween (-Si6H6-)(n) layers occurs through dehydrocoupling reactions whe
n the layered polysilane is heated under vacuum or an inert atmosphere
at temperatures of 100-200 degrees C. Structural changes in the silic
on network are evident during thermolysis: the layered structure of po
lysilane starts to collapse at 200 degrees C and is transformed to amo
rphous hydrogenated silicon and subsequently to crystalline silicon (c
-Si) at temperatures higher than 450 degrees C. This process is accomp
anied by the evolution of H-2 and SiH4 gases. The resulting layered po
lysilane exhibits strong room temperature photoluminescence at 560 nm
(ca. 2.2 eV) and a blue-shift of Si K-edge absorption (0.6 eV) relativ
e to c-Si. Annealing the layered polysilane results in red-shifts of l
uminescence peak energy with the increase of annealing temperature, co
nsistent with the trend observed in the Si K-edge absorption measureme
nt. These results are interpreted in terms of the growth of silicon ne
twork dimension during the thermolysis. The reduction in visible lumin
escence intensity for the annealed product at 300 degrees C (or higher
) is further attributed to the creation of defects, e.g., silicon dang
ling bonds (g = 2.0047) which provide pathways for non-radiative recom
bination. The relationship between layered polysilane (as well as its
annealed products) and porous Si is discussed.