T. Gurkov et al., ROLE OF SURFACE FORCES IN THE STABILITY OF EVAPORATING THIN LIQUID-FILMS THAT CONTAIN SURFACTANT MICELLES, Journal of colloid and interface science, 198(2), 1998, pp. 224-240
We consider an evaporating liquid him which lies on a planar heated so
lid substrate. The film contains a dissolved surfactant at a high conc
entration, so that micellar aggregates exist in the bulk. Linear stabi
lity analysis of this system is performed by investigating the time ev
olution of the amplitude of fluctuation waves. The liquid-vapor interf
ace is regarded as a two-dimensional continuum characterized by intrin
sic viscosity, specific adsorption, and surface tension. The latter qu
antities depend on the instantaneous subsurface concentration of surfa
ctant monomers (subject to fluctuation) and upon the temperature. At s
mall Reynolds and large Peclet numbers, and for thin films, the lubric
ation approximation model can be applied to solve the hydrodynamic pro
blem. In the balance of normal stress at the fluid interface, we accou
nt for the contribution of intermolecular forces. There are van der Wa
als, electrostatic, steric, and oscillatory structural interactions, w
hich are described in terms of separate components of disjoining press
ure. The oscillatory structural forces are due to the presence of surf
actant micelles or other colloidal particles in the film. These forces
turn out to have the highest magnitude, and are of great importance f
or the stability. We solve numerically the evolution equation for the
fluctuation, thus finding the critical thickness of film rupture and t
he critical lateral wave number. The influence of the surfactant type
and concentration and the relative significance of the particular inte
ractions under different conditions are discussed in detail. (C) 1998
Academic Press.