INITIAL-STAGES IN THE SM-SI(111) INTERFACE FORMATION

Citation
Tv. Krachino et al., INITIAL-STAGES IN THE SM-SI(111) INTERFACE FORMATION, Physics of the solid state, 40(2), 1998, pp. 341-347
Citations number
19
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
10637834
Volume
40
Issue
2
Year of publication
1998
Pages
341 - 347
Database
ISI
SICI code
1063-7834(1998)40:2<341:IITSIF>2.0.ZU;2-1
Abstract
The initial stages in the formation of the Sm-Si(111) interface have b een studied by thermal desorption, atomic beam modulation, and low-ene rgy-electron-diffraction spectroscopy. The structure of adsorbed films and samarium silicide films, as well as the Sm atom desorption kineti cs have been investigated within a broad range of surface coverages an d temperatures. The activation energy of desorption from the thermally most stable 3 x 2 submonolayer structure, as well as the binding ener gy of a single samarium atom with the substrate, have been measured. T he temperature of the onset of silicide decomposition and the activati on energy of this process have been determined. It is shown that the S m-Si(111) interface forms by a mechanism close to that of Stransky-Kra stanov. (C) 1998 American Institute of Physics.