X-RAY PHOTOELECTRON-SPECTROSCOPY (XPS) STUDIES OF O1S CORE-LEVEL IN Y-DOPED BI-2212 SUPERCONDUCTOR

Authors
RAJASEKAR P CHAKRABORTY P BANDYOPADHYAY SK BARAT P SEN P ADNOT A KNYSTAUTAS E
Citation
P. Rajasekar et al., X-RAY PHOTOELECTRON-SPECTROSCOPY (XPS) STUDIES OF O1S CORE-LEVEL IN Y-DOPED BI-2212 SUPERCONDUCTOR, Journal of the Korean Physical Society, 32(3), 1998, pp. 365-367
Citations number
9
Categorie Soggetti
Physics
Journal title
Journal of the Korean Physical Society → ACNP
ISSN journal
03744884
Volume
32
Issue
3
Year of publication
1998
Pages
365 - 367
Database
ISI
SICI code
0374-4884(1998)32:3<365:XP(SOO>2.0.ZU;2-8
Abstract
X-ray Photoelectron Spectroscopy (XPS) studies on Ols core levels of Y -doped Bi2Sr2CaCu2O8+delta (Bi-2212) have been carried out and are com pared with XPS studies on Ols core levels of the undoped Bi-2212. The results are discussed in terms of hole concentrations of the metal-oxy gen layers.