CHARACTERIZATION OF DIAMOND SINGLE-CRYSTALS BY MEANS OF DOUBLE-CRYSTAL X-RAY-DIFFRACTION AND POSITRON-ANNIHILATION

Citation
S. Fujii et al., CHARACTERIZATION OF DIAMOND SINGLE-CRYSTALS BY MEANS OF DOUBLE-CRYSTAL X-RAY-DIFFRACTION AND POSITRON-ANNIHILATION, Applied physics A: Materials science & processing, 61(3), 1995, pp. 331-333
Citations number
8
Categorie Soggetti
Physics, Applied
ISSN journal
09478396
Volume
61
Issue
3
Year of publication
1995
Pages
331 - 333
Database
ISI
SICI code
0947-8396(1995)61:3<331:CODSBM>2.0.ZU;2-F
Abstract
The crystallinity of synthesized and natural crystals of diamond was c haracterized by double-crystal X-ray diffraction and positron annihila tion. The two-dimensional angular correlation of annihilation radiatio n and positron lifetime measurements revealed that in natural crystals positroniums are formed in a high fraction. The synthesized crystal I b showed both an extremely small width for the diffraction and a posit ron lifetime spectrum with a single component of the lifetime of 115 p s. In contrast, the natural diamonds contain a long-lived component of lifetime longer than 2 ns. The diffusion length of positrons was also measured by a variable-energy positron beam. In the synthesized cryst al IIa, a diffusion length of about 100.8 nm was observed.