ORGANIC-SURFACE ANALYSIS BY 2-LASER ION-TRAP MASS-SPECTROMETRY - 2 - IMPROVED DESORPTION PHOTOIONIZATION CONFIGURATION/

Citation
O. Kornienko et al., ORGANIC-SURFACE ANALYSIS BY 2-LASER ION-TRAP MASS-SPECTROMETRY - 2 - IMPROVED DESORPTION PHOTOIONIZATION CONFIGURATION/, Analytical chemistry, 70(6), 1998, pp. 1208-1213
Citations number
27
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
00032700
Volume
70
Issue
6
Year of publication
1998
Pages
1208 - 1213
Database
ISI
SICI code
0003-2700(1998)70:6<1208:OAB2IM>2.0.ZU;2-J
Abstract
We previously described a two-laser ion trap mass spectrometer for mol ecular surface analysis of organic, biological, and polymeric surfaces (Kornienko, O.; et al. Anal. Chem. 1997, 69, 1536-1542). We have made several improvements in this instrument: a new 118-nm vacuum ultravio let (VUV) photoionization source and an improved desorption/ionization geometry in the ion trap, The improved surface analysis capabilities of this instrument are demonstrated on C-18 alkylsiloxane self-assembl ed monolayers on silicon, polypeptide thin films, mixed polystyrene th in films, and ion beam-modified polystyrene films. The new instrumenta l configuration has submonolayer sensitivity and the capability to per form tandem mass spectrometry on monolayer samples. The advantages of VUV photoionization for surface analysis studies are demonstrated to b e lower fragmentation and relatively nonselective ionization when comp ared with multiphoton ionization with ultraviolet light.